Semiconductor integrated circuit device having single-element ty

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257315, 257321, 257322, H01L 29788

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active

053008022

ABSTRACT:
A semiconductor integrated device having a non-volatile memory element or memory cell of a single-element type in a non-volatile memory circuit employing a field effect transistor which has, in addition to a floating gate electrode for storage of information and a controlling gate electrode, a source which includes a heavily doped region having a depth into the semiconductor substrate extending from the major surface thereof which is large. The single-element type field effect transistor, furthermore, has a drain which includes a lightly doped region which has a depth extending into the semiconductor substrate from the major surface thereof which is small.

REFERENCES:
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patent: 4665418 (1987-05-01), Mizutani
patent: 4698787 (1987-10-01), Mukherjee et al.
patent: 4784966 (1988-11-01), Chen
patent: 4804637 (1989-02-01), Smayling et al.
patent: 4835740 (1989-05-01), Sato
patent: 4859619 (1989-08-01), Wu et al.
patent: 4972371 (1990-11-01), Komori et al.
patent: 5079603 (1992-01-01), Komori et al.
Japanese Laid-Open No. S56-69866 to Nakamura. Jun. 11, 1981.
IEEE sponsored IEDM87 publication article entitled, "A Flash-Erase EEPROM Cell with an Asymmetric Source and Drain Structure", by H. Kume et al., IDEM 1987, 25.8, pp. 560-563.

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