X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1994-07-15
1995-09-05
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 34, 378 85, G21K 106
Patent
active
054486122
ABSTRACT:
An X-ray apparatus is disclosed which includes a mirror having a reflection surface, for expanding an X-ray beam in a predetermined direction, a detecting device for detecting a relative positional relationship between the X-ray beam and the reflection surface with respect to a direction perpendicular to the reflection surface, and an adjusting device for adjusting the relative position of the X-ray beam and the reflection surface on the basis of the detection. Also disclosed is an exposure apparatus and a semiconductor device manufacturing method using the X-ray apparatus.
REFERENCES:
patent: 5159621 (1992-10-01), Watanabe et al.
patent: 5195113 (1993-03-01), Kuwabara
Abe Naoto
Ebinuma Ryuichi
Hasegawa Takayuki
Kasumi Kazuyuki
Canon Kabushiki Kaisha
Porta David P.
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