Apparatus for configuring a subset of an integrated circuit havi

Details Apparatus for configuring a subset of an integrated circuit havi Apparatus for configuring a subset of an integrated circuit havi

1994-03-10

1995-09-05

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

36518912, 365221, 365154, 365185, 371 222, 371 223, G11C 2900

Patent

active

054485258

ABSTRACT:
An integrated circuit including a plurality of individual boundary scan circuits each associated with a separate portion of the circuitry of the integrated circuit. The registers of the individual boundary scan circuits are joined to provide a series boundary scan register chain in which individual portions of the circuitry included within the integrated circuit may be individually manipulated.

REFERENCES:
patent: 5132974 (1992-07-01), Rosales
patent: 5239510 (1993-08-01), Hill
patent: 5278841 (1994-01-01), Myers
patent: 5325367 (1994-06-01), Dekker et al.
patent: 5333139 (1994-07-01), Sturges
patent: 5343478 (1994-08-01), James et al.
patent: 5347519 (1994-09-01), Cooke et al.
patent: 5355369 (1994-10-01), Greenbergerl et al.
"The ABCs of Boundary-Scan Test," Fluke and Philips Test and Measurement Alliance, John Fluke Mfg. Co., Inc., 1991, pp. 6-25.

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