System for diagnosing defects in electronic assemblies

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371 24, 371 25, 371 20, 324 73AT, G01R 3128

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active

048477958

ABSTRACT:
A system (20) for diagnosing defects in electronic assemblies is disclosed. The system (20) comprises a knowledge base (26) for storing information regarding the electronic assembly for receiving current test failure data regarding an electronic assembly (12). The system further comprises a pattern search section (36) for comparing current test failure data to information stored in the knowledge base (26). A voting section (40) is also provided for generating a recommended repair procedure to eliminate the defect in the electronic assembly (12). Finally, the system (20) further comprises a historical pattern generation section (46) which updates the knowledge base (26) with information regarding whether the recommended repair procedure eliminated the defect.

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patent: 4648044 (1987-03-01), Hardy et al.
patent: 4649515 (1987-03-01), Thompson et al.
patent: 4709366 (1987-11-01), Scott et al.
patent: 4713815 (1987-12-01), Bryan et al.
Hayes-Roth, "The Knowledge-Based Expert System: A Tutorial", 9/84, pp. 11-28, IEEE, Computer.

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