Statistical debugging using paths and adaptive profiling

Details Statistical debugging using paths and adaptive profiling Statistical debugging using paths and adaptive profiling

2008-10-03

2011-11-22

Lohn, Joshua (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S025000, C714S047100

Reexamination Certificate

active

08065565

ABSTRACT:
The method executes the application and if there are no errors from the execution of the application, the method ends. If errors exist, the errors are collected from the execution of the application in an error report. Labeled application paths are created by adding a unique label to individual application paths where the application paths are individual loops and individual functions in the application. An analysis is created of the labeled application paths by executing the application with the labeled paths, reviewing the error report for data related to the labels and if an error is sufficiently related to application paths with labels, storing the path that created the errors in a report. If an error is not sufficient related to the application path with labels, the method is repeated by the creating the analysis again by substituting additional application paths for the application paths.

REFERENCES:
patent: 6938186 (2005-08-01), Das et al.
patent: 7140008 (2006-11-01), Chilimbi et al.
patent: 2005/0091646 (2005-04-01), Chilimbi et al.
patent: 2006/0059390 (2006-03-01), Duron et al.
patent: 2007/0055914 (2007-03-01), Chandwani et al.
patent: 2007/0079293 (2007-04-01), Wang et al.
patent: 2008/0005208 (2008-01-01), Vaswani et al.
patent: 2008/0126858 (2008-05-01), Barras
patent: 2009/0319621 (2009-12-01), Barsness et al.
Chilimib et al., “Low-Overhead Memory Leak Detection Using Adaptive Statistical Profiling,” http://64.233.183.104/search?q=cache:vL3hUIP3ojAJ:www-plan.cs.colorado.edu/˜hauswirt/Research/asplos04.pdf+statistical+debugging+using+paths+and+adaptive+profiling&hl=en&ct=clnk&cd=1&gl=in.
Ammons et al., “Improving Data-Flow Analysis with Path Profiles,” ACM 1998, http://www-plan.cs.colorado.edu/diwan/7135/p72-ammons.pdf.
Ball et al., “Optimally Profiling and Tracing Programs,” Association for Computing Machinery, Inc., 1994, http://citeseer.ist.psu.edu/cache/papers/cs/5138/http:zSzzSzwww.bell-labs.comzSz˜tballzSzpaperszSzoptproftrace.pdf/ball94optimally.pdf.
Gupta et al., “Locating Faulty Code Using Failure Inducing Chops,” ACM, 2005, http://www.cs.ucr.edu/˜gupta/research/Publications/Comp/ase05.pdf.
Chen et al., “Path-Based Failure and Evolution Management,” http://research.microsoft.com/˜emrek/pubs/paths-nsdi.pdf.
Nagpurkar et al., “Phase-Aware Remote Profiling”, www.cs.ucsb.edu/˜ckrintz/papers/cgo05.pdf.
“Software Artifact Infrastructure Repository”; downloaded May 13, 2008; http://sir.unl.edu/portal/index.html.
Arnold, M. et al.; “A Framework for Reducing the Cost of Instrumented Code*”; SIGPLAN Not.; vol. 36, No. 5; 2001; pp. 168-179.
Ball, T. et al.; “Efficient Path Profiling”; Proceedings of the 29th Annual International Symposium on Microarchitecture; 1996; Paris, France; pp. 46-57.
Ball, T. et al.; “From Symptom to Cause: Localizing Errors in Counterexample Traces”; SIGPLAN Not.; Jan. 2003; pp. 97-105.
Chilimbi, T.M. et al.; “HOLMES: Effective Statistical Debugging via Efficient Path Profiling”; Proceedings of the International Conference on Software Engineering (ICSE); May 2009; Association for Computing Machinery, Inc.
Cleve, H. et al.; “Locating Causes of Program Failures”; ICSE'05; May 15-21, 2005; St. Louis, Missouri.
Hirzel, M. et al.; “Bursty Tracing: A Framework for Low-Overhead Temporal Profiling”; 4thACM Workshop on Feedback-Directed and Dynamic Optimization; 2001.
Jones, J.A. et al.; “Empirical Evaluation of the Tarantula Automatic Fault-Localization Technique”; Proceedings of the 20thIEEE/ACM International Conference on Automated Software Engineering; Nov. 2005; Long Beach, California; pp. 273-282.
Jones, J.A. et al.; “Visualization of Test Information to Assist Fault Localization”; Proceedings of the 24thInternational Conference on Software Engineering; May 2002; Orlando, Florida; pp. 467-477.
Liblit, B. et al.; “Bug Isolation via Remote Program Sampling”; PLDI'03; Jun. 9-11, 2003; San Diego, California.
Liblit, B. et al.; “Scalable Statistical Bug Isolation”; PLDI'05; Jun. 12-15, 2005; Chicago, Illinois.
Liu, C. et al.; “SOBER: Statistical Model-based Bug Localization”; Proceedings of the European Software Engineering Conference and ACM SIGSOFT Symposium on the Foundations of Software Engineering; Sep. 2005; pp. 286-295.
Nainar, P.A. et al.; “Statistical Debugging Using Compound Boolean Predicates”; Proceedings of the 2007 International Symposium on Software Testing and Analysis; 2007; pp. 5-15.
Vaswani, K. et al.; “Preferential Path Profiling: Compactly Numbering Interesting Paths”; Proceedings of the 34thAnnual ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages; 2007.
Zheng, A., et al.; “Statistical Debugging: Simultaneous Identification of Multiple Bugs”; ICML'06; 2006; ACM Press; New York, NY; pp. 1105-1112.

Affiliated with

Also associated with

Rating

Statistical debugging using paths and adaptive profiling does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Statistical debugging using paths and adaptive profiling, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Statistical debugging using paths and adaptive profiling will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4312088