Tunnel effect transistors based on elongate monocrystalline...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

08072012

ABSTRACT:
Tunnel field-effect transistors (TFETs) are regarded as successors of metal-oxide semiconductor field-effect transistors (MOSFETs), but silicon-based TFETs typically suffer from low on-currents, a drawback related to the large resistance of the tunnel barrier. To achieve higher on-currents an elongate monocrystalline nanostructure-based TFET with a heterostructure made of a different semiconducting material (e.g. germanium (Ge)) is used. An elongate monocrystalline nanostructure made of a different semiconducting material is introduced which acts as source (or alternatively drain) region of the TFET. The introduction of the heterosection is such that the lattice mismatch between silicon and germanium does not result in a highly defective interface. A dynamic power reduction as well as a static power reduction can result, compared to conventional MOSFET configurations. Multiple layers of logic can therefore be envisioned with these elongate monocrystalline nanostructure Si/Ge TFETs resulting in ultra-high on-chip transistor densities.

REFERENCES:
patent: 5313484 (1994-05-01), Arimoto
patent: 5471075 (1995-11-01), Shekar et al.
patent: 7425491 (2008-09-01), Forbes
patent: 7446372 (2008-11-01), Forbes
patent: 7491995 (2009-02-01), Forbes
patent: 7579653 (2009-08-01), Suh et al.
patent: 7714386 (2010-05-01), Pesetski et al.
patent: 2003/0098488 (2003-05-01), O'Keeffe et al.
patent: 2003/0170930 (2003-09-01), Choi et al.
patent: 2004/0262636 (2004-12-01), Yang et al.
patent: 2005/0028860 (2005-02-01), Sano et al.
patent: 2005/0274992 (2005-12-01), Appenzeller et al.
patent: 2006/0138528 (2006-06-01), Kang et al.
patent: 2006/0258072 (2006-11-01), Kavalieros et al.
patent: 2006/0258076 (2006-11-01), Mizushima et al.
patent: 2007/0001232 (2007-01-01), King et al.
patent: 2007/0178650 (2007-08-01), Chen et al.
patent: 2008/0050881 (2008-02-01), Chen et al.
patent: 2008/0067495 (2008-03-01), Verhulst
patent: 2008/0067607 (2008-03-01), Verhulst et al.
patent: 2008/0303058 (2008-12-01), Mori et al.
patent: 2010/0133601 (2010-06-01), Miyazaki et al.
Bhuwalka et al. “A Simulation Approach to Optimize the Electrical Parameters of a Vertical Tunnel FET”.
Bhuwalka et al., IEEE Transactions on Electron Devices, vol. 52, No. 7, Jul. 2005.
Glas, F. “Critical dimensions for the plastic relaxation of strained axial heterostructures in free-standing nanowires”, Phys. Rev. B 74, 121302(R) (2006).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Tunnel effect transistors based on elongate monocrystalline... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Tunnel effect transistors based on elongate monocrystalline..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tunnel effect transistors based on elongate monocrystalline... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4302445

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.