Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-08
2011-11-01
Stark, Jarrett (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S351000, C257SE27046
Reexamination Certificate
active
08049253
ABSTRACT:
A semiconductor device and a method for manufacturing a semiconductor device are provided. A semiconductor device comprises a first single-crystal semiconductor layer including a first channel formation region and a first impurity region over a substrate having an insulating surface, a first gate insulating layer over the first single-crystal semiconductor layer, a gate electrode over the first gate insulating layer, a first interlayer insulating layer over the first gate insulating layer, a second gate insulating layer over the gate electrode and the first interlayer insulating layer, and a second single-crystal semiconductor layer including a second channel formation region and a second impurity region over the second gate insulating layer. The first channel formation region, the gate electrode, and the second channel formation region are overlapped with each other.
REFERENCES:
patent: 5374564 (1994-12-01), Bruel
patent: 5426315 (1995-06-01), Pfiester
patent: 5757047 (1998-05-01), Nakamura
patent: 5933736 (1999-08-01), Nakamura
patent: 6127702 (2000-10-01), Yamazaki et al.
patent: 6271101 (2001-08-01), Fukunaga
patent: 6320228 (2001-11-01), Yu
patent: 6335231 (2002-01-01), Yamazaki et al.
patent: 6380046 (2002-04-01), Yamazaki
patent: 6388652 (2002-05-01), Yamazaki et al.
patent: 6602761 (2003-08-01), Fukunaga
patent: 6686623 (2004-02-01), Yamazaki
patent: 6778164 (2004-08-01), Yamazaki et al.
patent: 6803264 (2004-10-01), Yamazaki et al.
patent: 6821826 (2004-11-01), Chan et al.
patent: 6875633 (2005-04-01), Fukunaga
patent: 7067926 (2006-06-01), Yamazaki et al.
patent: 7105448 (2006-09-01), Takayama et al.
patent: 7176525 (2007-02-01), Fukunaga
patent: 7199024 (2007-04-01), Yamazaki
patent: 7256776 (2007-08-01), Yamazaki et al.
patent: 2003/0171837 (2003-09-01), Yamazaki et al.
patent: 2004/0104424 (2004-06-01), Yamazaki
patent: 2004/0195572 (2004-10-01), Kato et al.
patent: 2005/0009252 (2005-01-01), Yamazaki et al.
patent: 2005/0026339 (2005-02-01), Gonzalez
patent: 2005/0067620 (2005-03-01), Chan et al.
patent: 2005/0069788 (2005-03-01), Tanaka et al.
patent: 2005/0127371 (2005-06-01), Yamazaki et al.
patent: 2006/0071074 (2006-04-01), Konevecki et al.
patent: 2006/0214306 (2006-09-01), Yamazaki et al.
patent: 2006/0292879 (2006-12-01), Takayama et al.
patent: 2007/0090417 (2007-04-01), Kudo
patent: 2007/0108510 (2007-05-01), Fukunaga
patent: 2007/0173000 (2007-07-01), Yamazaki
patent: 2007/0184632 (2007-08-01), Yamazaki et al.
patent: 2007/0291022 (2007-12-01), Yamazaki et al.
patent: 05-335482 (1993-12-01), None
patent: 07-193188 (1995-07-01), None
patent: 2003-234474 (2003-08-01), None
patent: 2005-107195 (2005-04-01), None
patent: 2005-109498 (2005-04-01), None
patent: 2006-147897 (2006-06-01), None
patent: 2006-287238 (2006-10-01), None
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
Stark Jarrett
Tynes, Jr. Lawrence
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