Internal voltage generation circuit

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator

Reexamination Certificate

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Details

C365S189050, C365S189110, C365S189070

Reexamination Certificate

active

08050112

ABSTRACT:
An internal voltage generation circuit includes a temperature detection unit which detects an internal temperature of a semiconductor memory device and generates a temperature signal, a driving control signal generation unit which receives the temperature signal and generates first and second driving control signals, and an internal voltage generation unit which receives the first and second driving control signals and generates an internal voltage.

REFERENCES:
patent: 5396116 (1995-03-01), Watanabe et al.
patent: 5691661 (1997-11-01), Fukuda et al.
patent: 7940112 (2011-05-01), Okuno et al.
patent: 7953573 (2011-05-01), Walker
patent: 2009/0027105 (2009-01-01), Son
patent: 2009/0091376 (2009-04-01), Kim et al.
patent: 2010/0061172 (2010-03-01), Chen
patent: 2010/0195414 (2010-08-01), Kim et al.
patent: 10-2007-0024068 (2007-03-01), None
patent: 10-2007-0080883 (2007-08-01), None

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