Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2009-07-30
2011-10-25
Lee, Eugene (Department: 2815)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C257S059000, C257S072000
Reexamination Certificate
active
08043902
ABSTRACT:
The present invention provides a TFT including at least one LDD region in a self-alignment manner without forming a sidewall spacer and increasing the number of manufacturing steps. A photomask or a reticle provided with an assist pattern that is formed of a diffraction grating pattern or a semi-transmitting film and has a function of reducing light intensity is employed in a photolithography step of forming a gate electrode, an asymmetrical resist pattern having a region with a thick thickness and a region with a thickness thinner than that of the above region on one side is formed, a gate electrode having a stepped portion is formed, and an LDD region is formed in a self-alignment manner by injecting an impurity element to the semiconductor layer through the region with a thin thickness of the gate electrode.
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Chinese Patent Office Action (Chinese Patent Application No. 200610091544.9) dated Apr. 3, 2009, with translation; 24 pages.
C.W. Kim et al.; “A Novel Four-Mask-Count Process Architecture for TFT-LCDS”;SID '00 Digest; pp. 1006-1009; 2000.
Monoe Shigeharu
Ohnuma Hideto
Yamazaki Shunpei
Fish & Richardson P.C.
Ho Anthony
Lee Eugene
Semiconductor Energy Laboratory Co,. Ltd.
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