Top layers of metal for high performance IC's

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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C257SE23142

Reexamination Certificate

active

08035227

ABSTRACT:
The present invention adds one or more thick layers of polymer dielectric and one or more layers of thick, wide metal lines on top of a finished semiconductor wafer, post-passivation. The thick, wide metal lines may be used for long signal paths and can also be used for power buses or power planes, clock distribution networks, critical signal, and re-distribution of I/O pads for flip chip applications. Photoresist defined electroplating, sputter/etch, or dual and triple damascene techniques are used for forming the metal lines and via fill.

REFERENCES:
patent: 4423547 (1984-01-01), Farrar et al.
patent: 4618878 (1986-10-01), Aoyama et al.
patent: 4685998 (1987-08-01), Quinn et al.
patent: 4789647 (1988-12-01), Peters
patent: 5046161 (1991-09-01), Takada
patent: 5055907 (1991-10-01), Jacobs
patent: 5061985 (1991-10-01), Meguro et al.
patent: 5083187 (1992-01-01), Lamson et al.
patent: 5106461 (1992-04-01), Volfson et al.
patent: 5120572 (1992-06-01), Kumar
patent: 5179448 (1993-01-01), Steinhardt et al.
patent: 5212403 (1993-05-01), Nakanishi et al.
patent: 5226232 (1993-07-01), Boyd
patent: 5227013 (1993-07-01), Kumar
patent: 5244833 (1993-09-01), Gansauge et al.
patent: 5384488 (1995-01-01), Golshan et al.
patent: 5436412 (1995-07-01), Ahmad et al.
patent: 5468984 (1995-11-01), Efland et al.
patent: 5501006 (1996-03-01), Gehman, Jr. et al.
patent: 5532512 (1996-07-01), Fillion et al.
patent: 5563085 (1996-10-01), Kohyama
patent: 5635767 (1997-06-01), Wenzel et al.
patent: 5659201 (1997-08-01), Wollesen
patent: 5665989 (1997-09-01), Dangelo
patent: 5686764 (1997-11-01), Fulcher
patent: 5691248 (1997-11-01), Cronin et al.
patent: 5719448 (1998-02-01), Ichikawa
patent: 5767010 (1998-06-01), Mis et al.
patent: 5773888 (1998-06-01), Hosomi et al.
patent: 5783483 (1998-07-01), Gardner
patent: 5789303 (1998-08-01), Leung
patent: 5792594 (1998-08-01), Brown et al.
patent: 5818110 (1998-10-01), Cronin et al.
patent: 5827776 (1998-10-01), Bandyopadhyay et al.
patent: 5827778 (1998-10-01), Yamada
patent: 5834844 (1998-11-01), Akagawa et al.
patent: 5854513 (1998-12-01), Kim
patent: 5883435 (1999-03-01), Geffken et al.
patent: 5892273 (1999-04-01), Iwasaki et al.
patent: 5910020 (1999-06-01), Yamada
patent: 5937320 (1999-08-01), Andricacos et al.
patent: 5952726 (1999-09-01), Liang
patent: 5953626 (1999-09-01), Hause et al.
patent: 5969424 (1999-10-01), Matsuki et al.
patent: 5994766 (1999-11-01), Shenoy et al.
patent: 6001538 (1999-12-01), Chen et al.
patent: 6011314 (2000-01-01), Leibovitz et al.
patent: 6020640 (2000-02-01), Efland et al.
patent: 6022792 (2000-02-01), Ishii et al.
patent: 6066877 (2000-05-01), Williams et al.
patent: 6075290 (2000-06-01), Schaefer et al.
patent: 6077726 (2000-06-01), Mistry et al.
patent: 6087250 (2000-07-01), Hyakutake
patent: 6100548 (2000-08-01), Nguyen et al.
patent: 6103552 (2000-08-01), Lin
patent: 6121159 (2000-09-01), Pasch
patent: 6124198 (2000-09-01), Moslehi
patent: 6130457 (2000-10-01), Yu et al.
patent: 6144100 (2000-11-01), Shen et al.
patent: 6146985 (2000-11-01), Wollesen
patent: 6153521 (2000-11-01), Cheung et al.
patent: 6174810 (2001-01-01), Islam et al.
patent: 6184143 (2001-02-01), Ohashi et al.
patent: 6187680 (2001-02-01), Costrini et al.
patent: 6229221 (2001-05-01), Kloen et al.
patent: 6272736 (2001-08-01), Lee
patent: 6288447 (2001-09-01), Amishiro et al.
patent: 6300234 (2001-10-01), Flynn et al.
patent: 6330234 (2001-12-01), Tomasi et al.
patent: 6350705 (2002-02-01), Lin
patent: 6359328 (2002-03-01), Dubin
patent: 6362087 (2002-03-01), Wang et al.
patent: 6383916 (2002-05-01), Lin
patent: 6410435 (2002-06-01), Ryan
patent: 6417575 (2002-07-01), Harada et al.
patent: 6429120 (2002-08-01), Ahn et al.
patent: 6455885 (2002-09-01), Lin
patent: 6459135 (2002-10-01), Basteres et al.
patent: 6472745 (2002-10-01), Iizuka
patent: 6495442 (2002-12-01), Lin et al.
patent: 6518092 (2003-02-01), Kikuchi
patent: 6538326 (2003-03-01), Shimizu et al.
patent: 6544880 (2003-04-01), Akram
patent: 6555459 (2003-04-01), Tokushige et al.
patent: 6578754 (2003-06-01), Tung
patent: 6593222 (2003-07-01), Smoak
patent: 6593649 (2003-07-01), Lin et al.
patent: 6605524 (2003-08-01), Fan et al.
patent: 6605528 (2003-08-01), Lin et al.
patent: 6605549 (2003-08-01), Leu et al.
patent: 6614091 (2003-09-01), Downey et al.
patent: 6639299 (2003-10-01), Aoki
patent: 6646347 (2003-11-01), Mercado et al.
patent: 6649509 (2003-11-01), Lin et al.
patent: 6653563 (2003-11-01), Bohr
patent: 6660728 (2003-12-01), Scheunemann et al.
patent: 6680544 (2004-01-01), Lu et al.
patent: 6683380 (2004-01-01), Efland et al.
patent: 6707124 (2004-03-01), Wachtler et al.
patent: 6707159 (2004-03-01), Kumamoto et al.
patent: 6709973 (2004-03-01), Sakamoto
patent: 6710460 (2004-03-01), Morozumi
patent: 6713381 (2004-03-01), Barr et al.
patent: 6756295 (2004-06-01), Lin et al.
patent: 6780748 (2004-08-01), Yamaguchi et al.
patent: 6798050 (2004-09-01), Homma et al.
patent: 6800555 (2004-10-01), Test et al.
patent: 6818540 (2004-11-01), Martin et al.
patent: 6826517 (2004-11-01), Okada
patent: 6844631 (2005-01-01), Yong et al.
patent: 6847006 (2005-01-01), Yamazaki et al.
patent: 6847066 (2005-01-01), Tahara et al.
patent: 6861740 (2005-03-01), Hsu
patent: 6894399 (2005-05-01), Vu et al.
patent: 6900541 (2005-05-01), Wang et al.
patent: 6900545 (2005-05-01), Sebesta et al.
patent: 6943101 (2005-09-01), Brintzinger
patent: 6943440 (2005-09-01), Kim et al.
patent: 6963136 (2005-11-01), Shinozaki et al.
patent: 6979647 (2005-12-01), Bojkov et al.
patent: 7239028 (2007-07-01), Anzai
patent: 7355282 (2008-04-01), Lin et al.
patent: 7405149 (2008-07-01), Lin et al.
patent: 2001/0035452 (2001-11-01), Test et al.
patent: 2001/0051426 (2001-12-01), Pozder et al.
patent: 2002/0000671 (2002-01-01), Zuniga et al.
patent: 2002/0043723 (2002-04-01), Shimizu et al.
patent: 2002/0158334 (2002-10-01), Vu et al.
patent: 2003/0102551 (2003-06-01), Kikuchi
patent: 2003/0218246 (2003-11-01), Abe et al.
patent: 2004/0023450 (2004-02-01), Katagiri et al.
patent: 2006/0063371 (2006-03-01), Lin et al.
patent: 2006/0063378 (2006-03-01), Lin et al.
patent: 2008/0246154 (2008-10-01), Lin et al.
patent: 01-135043 (1989-05-01), None
patent: 01135043 (1989-05-01), None
patent: 01-183836 (1989-07-01), None
patent: 01-184848 (1989-07-01), None
patent: 01-184849 (1989-07-01), None
patent: 01184849 (1989-07-01), None
patent: 04-316351 (2008-06-01), None
Mistry, K. et al. “A 45nm Logic Technology with High-k+ Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging,” IEEE International Electron Devices Meeting (2007) pp. 247-250.
Edelstein, D.C., “Advantages of Copper Interconnects,” Proceedings of the 12th International IEEE VLSI Multilevel Interconnection Conference (1995) pp. 301-307.
Theng, C. et al. “An Automated Tool Deployment for ESD (Electro-Static-Discharge) Correct-by-Construction Strategy in 90 nm Process,” IEEE International Conference on Semiconductor Electronics (2004) pp. 61-67.
Gao, X. et al. “An improved electrostatic discharge protection structure for reducing triggering voltage and parasitic capacitance,” Solid-State Electronics, 27 (2003), pp. 1105-1110.
Yeoh, a. et al. “Copper Die Bumps (First Level Interconnect) and Low-K Dielectrics in 65nm High vol. Manufacturing,” Electronic Components and Technology Conference (2006) pp. 1611-1615.
Hu, C-K. et al. “Copper-Polyimide Wiring Technology for VLSI Circuits,” Materials Research Society Symposium Proceedings VLSI V (1990) pp. 369-373.
Roesch, W. et al. “Cycling copper flip chip interconnects,” Microelectronics Reliability, 44 (2004) pp. 1047-1054.
Lee, Y-H. et al. “Effect of ESD Layout on the Assembly Yield and Reliability,” International Electron Devices Meeting (2006) pp. 1-4.
Yeoh, T-S. “ESD Effects on Power Supply Clamps,” Proceedings of the 6th International Sympoisum on Physical & Failure Analysis of Integrated Circuits (1997) pp. 121-124.
Edelstein,

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