Nonvolatile semiconductor memory with erase gate and its...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S315000, C257S316000, C257SE29129, C257SE29300

Reexamination Certificate

active

08058680

ABSTRACT:
A nonvolatile semiconductor memory device includes a semiconductor substrate, a select gate formed above the semiconductor substrate, a floating gate formed above the semiconductor substrate and an erase gate positioned lower than an upper surface of the floating gate, and opposite an edge of a lower surface of the floating gate.

REFERENCES:
patent: 7718488 (2010-05-01), Chen et al.
patent: 2004/0065917 (2004-04-01), Fan et al.
patent: 2005/0207225 (2005-09-01), Chen et al.
patent: 2005/0275002 (2005-12-01), Shone
patent: 2006/0068529 (2006-03-01), Chen et al.
patent: 2007/0166903 (2007-07-01), Lojek
patent: 2008/0017917 (2008-01-01), Lin et al.
patent: 2009/0039410 (2009-02-01), Liu et al.
patent: 2000-286348 (2000-10-01), None
patent: 2001-230330 (2001-08-01), None

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