Positive type resist composition for use in liquid immersion...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S311000, C430S905000, C430S913000, C430S945000

Reexamination Certificate

active

08039197

ABSTRACT:
A positive type resist composition for use in liquid immersion exposure comprises: (A) a resin having a monocyclic or polycyclic cycloaliphatic hydrocarbon structure, the resin increasing its solubility in an alkali developer by an action of acid; (B) a compound generating acid upon irradiation with one of an actinic ray and a radiation; (C) an alkali soluble compound having an alkyl group of 5 or more carbon atoms; and (D) a solvent.

REFERENCES:
patent: 6589705 (2003-07-01), Sato et al.
patent: 6627391 (2003-09-01), Ito et al.
patent: 6788477 (2004-09-01), Lin
patent: 6824956 (2004-11-01), Sato
patent: 7087356 (2006-08-01), Khojasteh et al.
patent: 7189492 (2007-03-01), Kodama et al.
patent: 7252924 (2007-08-01), Yamanaka et al.
patent: 7569326 (2009-08-01), Ohsawa et al.
patent: 2003/0224287 (2003-12-01), Fujimori
patent: 2003/0235781 (2003-12-01), Shida et al.
patent: 2004/0197707 (2004-10-01), Yamanaka et al.
patent: 2005/0019690 (2005-01-01), Kodama
patent: 2005/0069819 (2005-03-01), Shiobara
patent: 2005/0094125 (2005-05-01), Arai
patent: 2005/0208420 (2005-09-01), Ober et al.
patent: 2005/0227173 (2005-10-01), Hatakeyama et al.
patent: 2005/0260519 (2005-11-01), Berger et al.
patent: 2006/0141400 (2006-06-01), Hirayama et al.
patent: 2006/0172225 (2006-08-01), Mintz et al.
patent: 2006/0246373 (2006-11-01), Wang
patent: 2007/0134593 (2007-06-01), Hirayama et al.
patent: 1 347 335 (2003-09-01), None
patent: 1 376 232 (2004-01-01), None
patent: 1 505 439 (2005-02-01), None
patent: 1517179 (2005-03-01), None
patent: 57-153433 (1982-09-01), None
patent: 7-220990 (1995-08-01), None
patent: 10-303114 (1998-11-01), None
patent: 2000-035664 (2000-02-01), None
patent: 2002-62640 (2002-02-01), None
patent: 2003-156845 (2003-05-01), None
patent: 2003-262952 (2003-09-01), None
patent: 2003-270791 (2003-09-01), None
patent: 2003-302762 (2003-10-01), None
patent: 2003-302763 (2003-10-01), None
patent: 2003-330195 (2003-11-01), None
patent: 2004-77817 (2004-03-01), None
patent: 2004-117677 (2004-04-01), None
patent: 2004-126302 (2004-04-01), None
patent: 2004-238304 (2004-08-01), None
patent: 2005-128146 (2005-05-01), None
patent: 2005-320516 (2005-11-01), None
patent: 02/44814 (2002-06-01), None
patent: 03-099782 (2003-12-01), None
patent: 2004/074937 (2004-09-01), None
patent: 2005/008336 (2005-01-01), None
J. A. Hoffnagle, et al., “Liquid immersion deep-ultraviolet interferometric lithography”, J. Vac. Sci. Technol. B., Nov./Dec. 1999, pp. 3306-3309, vol. 17, No. 6.
B. J. Lin, “Semiconductor Foundry, Lithography, and Partners”, Proceedings of SPIE, 2002, pp. 11-24, vol. 4688.
Shinji Kishimura et al., “Resist interaction in 193-/157-nm immersion lithography” (2004), Proceedings of SPIE, vol. 5376, pp. 44-55.
William Hinsberg et al., “Liquid Immersion Lithography—Evaluation of Resist Issues” (2004), Proceedings of SPIE, vol. 5376, pp. 21-33.
European Search Report dated Feb. 20, 2006.
Notification of Reasons for Refusal issued in counterpart Japanese Application No. 2005-196529 dated Apr. 13, 2010.
Office Action dated Dec. 7, 2010 on Japanese Patent Application No. 2005-196529.
Notification of Reasons for Refusal issued Sep. 7, 2010 in counterpart Japanese Application No. 2005-196529.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Positive type resist composition for use in liquid immersion... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Positive type resist composition for use in liquid immersion..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Positive type resist composition for use in liquid immersion... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4280261

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.