Resistance change memory device

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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C365S163000

Reexamination Certificate

active

08031508

ABSTRACT:
A resistance change memory device includes: a memory cell array with memory cells arranged therein, the memory cell having a variable resistance element for storing a rewritable resistance value; a reference cell formed of the same memory cells as those set in a high resistance state in the memory cell array, the reference cell being trimmed with selection of the number of parallel-connected memory cells to have a reference current value used for detecting data in the memory cell array; and a sense amplifier configured to compare a cell current value of a memory cell selected in the memory cell array with the reference current value of the reference cell.

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U.S. Appl. No. 12/668,750, filed Jan. 12, 2010, Toda, et al.
Y. Hosoi, et al., “High Speed Unipolar Switching Resistance RAM (RRAM) Technology”, IEEE Int. Elec. Dev. Meeting, Technical Dig. 2006, 4 pages.

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