Test structures for development of metal-insulator-metal...

Details Test structures for development of metal-insulator-metal... Test structures for development of metal-insulator-metal...

2008-11-17

2011-12-27

Huynh, Andy (Department: 2818)

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

C257S532000, C257SE21521, C257SE21524, C257SE29343

Reexamination Certificate

active

08084770

ABSTRACT:
In the present electronic test structure comprising, a conductor is provided, overlying a substrate. An electronic device overlies a portion of the conductor and includes a first electrode connected to the conductor, a second electrode, and an insulating layer between the first and second electrodes. A portion of the conductor is exposed for access thereto.

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