Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-05-15
2011-12-13
Gurley, Lynne (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S328000, C257S334000, C257SE21417, C257SE21418, C257SE29257, C438S218000, C438S224000, C438S268000, C438S358000
Reexamination Certificate
active
08076725
ABSTRACT:
An impurity buried layer constructed by two buried regions formed by impurities of identical type exist, a buried region formed by an impurity having a slow diffusion speed is provided on the entire surface of a transistor formation region, and a buried region formed by an impurity having a fast diffusion speed is provided inwardly from beneath the inside end of an isolation insulating film serving as a region on which an electric field concentrates partially.
REFERENCES:
patent: 4589004 (1986-05-01), Yasuda et al.
patent: 5132235 (1992-07-01), Williams et al.
patent: 2004/0248389 (2004-12-01), Iwabuchi
patent: 2003-303964 (2003-10-01), None
patent: 2003-347546 (2003-12-01), None
Gurley Lynne
Li Meiya
McGinn IP Law Group PLLC
Renesas Electronics Corporation
LandOfFree
Semiconductor device and method for manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method for manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method for manufacturing the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4256257