Delay variation analysis apparatus and delay variation...

Details Delay variation analysis apparatus and delay variation... Delay variation analysis apparatus and delay variation...

2009-05-07

2011-12-13

Nghiem, Michael (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Statistical measurement

Reexamination Certificate

active

08078428

ABSTRACT:
A method for analyzing a delay time distribution of an N-stage circuit. The method includes a delay time calculation step of calculating maximum deviation delay time of a signal propagating through the circuit and basic delay time of the circuit, a delay variation calculation step of calculating a delay variation value of the N-stage circuit by using the mean square of differences between the maximum deviation delay time of the circuit and the basic delay time of the circuit taken over the N stages, and a step of generating the delay time distribution of the N-stage circuit as a normal distribution by using the calculated delay variation value.

REFERENCES:
patent: 2004/0167756 (2004-08-01), Yonezawa
patent: 2005/0010883 (2005-01-01), Wood
patent: 2006/0059446 (2006-03-01), Chen et al.
patent: 2006/0225014 (2006-10-01), Hosono
patent: 2008/0066025 (2008-03-01), Tanaka
patent: 2005-11892 (2005-01-01), None
Izumi Nitta, et al., “A Study of the Model and the Accuracy of Statistical Timing Analysis,” IEICE Technical Report (Institute of Electronics, Information and Communication Engineers), vol. 105, No. 448 (DC2005 38-52); Dec. 2005, pp. 61-66, Abstract only.

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