Semiconductor device comprising a thin film transistor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S059000, C257S072000, C257SE29151

Reexamination Certificate

active

07821065

ABSTRACT:
An object of the present invention is to provide a semiconductor device having high operation characteristic and reliability.The measures taken are: A pixel capacitor is formed between an electrode comprising anodic capable material over an organic resin film, an anodic oxide film of the electrode and a pixel electrode above. Since the anodic oxide film is anodically oxidized by applied voltage per unit time at 15 V/min, there is no wrap around on the electrode, and film peeling can be prevented.

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