Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-08-03
2010-10-19
Smith, Zandra (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S333000
Reexamination Certificate
active
07816246
ABSTRACT:
Fuses for integrated circuits and semiconductor devices and methods for using the same. The semiconductor fuse contains two conductive layers, an overlying and underlying refractory metal nitride layer, on an insulating substrate. The semiconductor fuse may be fabricated during manufacture of a local interconnect structure including the same materials. The fuse, which may be used to program redundant circuitry, may be blown by electrical current rather than laser beams, thus allowing the fuse width to be smaller than prior art fuses blown by laser beams. The fuse may also be blown by less electrical current than the current required to blow conventional polysilicon fuses having similar dimensions.
REFERENCES:
patent: 4491860 (1985-01-01), Lim
patent: 6486528 (2002-11-01), Pedersen et al.
patent: 2002/0127781 (2002-09-01), Gonzalez et al.
Fukuda, Yukio, et al.,A New Fusible-Type Programmable Element Composed of Aluminum and Polysilicon. IEEE Transactions on Electron Devices, vol. ED-33, No. 2, Feb. 1986.
Trivedi Jigish
Violette Michael P.
Wang Zhongze
Micro)n Technology, Inc.
Perkins Pamela E
Smith Zandra
TraskBritt
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