Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-08-01
2010-02-16
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C430S005000, C430S030000
Reexamination Certificate
active
07665051
ABSTRACT:
A method and a device can be used for checking the layout of an electronic circuit of a semiconductor component. For example, the method includes an automatic classification of cells in at least one layout into a cell database, and an automatic layout checker comparing the cell database to a layout to be checked.
REFERENCES:
patent: 5249134 (1993-09-01), Oka
patent: 6308143 (2001-10-01), Segawa
patent: 7024640 (2006-04-01), Buchanan
patent: 2003/0154461 (2003-08-01), Pierrat
patent: 2003/0159120 (2003-08-01), Baader et al.
Ludwig Burkhard
Mueller Uwe
Chiang Jack
Doan Nghia M
Qimonda AG
Slater & Matsil L.L.P.
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