Semiconductor storage device equipped with ECC function

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Details

Other Related Categories

C365S185090

Type

Reexamination Certificate

Status

active

Patent number

07810016

Description

ABSTRACT:
A semiconductor memory device includes a memory cell array, an ECC (error correction code) circuit and a decision circuit. The ECC circuit calculates an error correction code for write data to be written in the memory cell array. The decision circuit invalidates the ECC circuit when a data width of the write data is less than a predetermined data width.

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Japanese Patent Office issued a Japanese Office Action dated Sep. 28, 2009, Application No. 2005327011.

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