Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material
Reexamination Certificate
2008-08-18
2010-11-23
Blum, David S (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Organic semiconductor material
C257S005000, C257SE47001, C257SE51003
Reexamination Certificate
active
07838873
ABSTRACT:
A method of forming a stochastically based integrated circuit encryption structure includes forming a lower conductive layer over a substrate, forming a short prevention layer over the lower conductive layer, forming an intermediate layer over the short prevention layer, wherein the intermediate layer is characterized by randomly structured nanopore features. An upper conductive layer is formed over the random nanopore structured intermediate layer. The upper conductive layer is patterned into an array of individual cells, wherein a measurable electrical parameter of the individual cells has a random distribution from cell to cell with respect to a reference value of the electrical parameter.
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Clevenger Lawrence A.
Colburn Matthew E.
Dalton Timothy J.
Gaidis Michael C.
Hon Wong Keith Kwong
Blum David S
Cantor & Colburn LLP
International Business Machines - Corporation
Percello Louis
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