Field effect transistor and method for producing a field...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S343000, C257S349000, C257S336000, C438S289000, C438S290000, C438S291000

Reexamination Certificate

active

07821062

ABSTRACT:
A field effect transistor is provided having a source region, a drain region formed in a first well region, and a channel region. The first well region is doped with doping atoms of a first conductivity type. At least a part of the channel region which extends into the first well region is doped with doping atoms of a second conductivity type, the second conductivity type being a different conductivity type than the first conductivity type.

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patent: 6548874 (2003-04-01), Morton et al.
patent: 2002/0117714 (2002-08-01), Hebert
patent: 2003/0022452 (2003-01-01), Petti
patent: 2006/0220120 (2006-10-01), Horch
patent: 1 487 023 (2004-12-01), None
SoC Integration in Deep Submicron CMOS, P. Rickert and B. Haroun, Proceedings IEDM 2004, p. 653-656.
High-Voltage Drain Extended MOS Transistors for 0.18-μm Logic CMOS Process, J.C. Mitros, et al., IEEE Transactions on Electron Devices, vol. 48, No. 8, pp. 1751-1755, Aug. 2001.

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