Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-07-21
2010-12-28
Hu, Shouxiang (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S222000, C257S223000, C257SE27132
Reexamination Certificate
active
07859032
ABSTRACT:
During an exposure time period (long accumulation time period) of a low shutter speed shooting mode, a second reference voltage Vss2, which is different from a first reference voltage Vss1(a ground voltage) corresponding to a reference voltage of a peripheral circuit, is applied to a well (5) where a photoelectric converter section (2) and a drain region (4) are formed, whereby generation of dark electrons at a portion of a surface of the well (5) below a gate electrode (6) is suppressed. A polarity of the second reference voltage Vss2is positive in the case where a conductivity type of the well (5) is a P-type, and is negative in the case of an N-type.
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Inagaki Makoto
Matsunaga Yoshiyuki
Hu Shouxiang
McDermott Will & Emery LLP
Panasonic Corporation
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