Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-02-23
2010-06-22
Nguyen, Cuong Q (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S328000, C257S329000, C257S331000, C257S332000, C257S333000, C257S334000, C257S335000, C257S336000, C257SE29201, C365S149000
Reexamination Certificate
active
07741675
ABSTRACT:
A semiconductor component has a semiconductor body in which a trench structure is provided. An electrode structure embedded in the trench structure is at least partly insulated from its surroundings by an insulation structure, and is contact-connected in a contact-connecting region via a contact hole that penetrates through an upper region of the insulation structure. The semiconductor component has at least two trenches running next to one another, at least one of said trenches containing a part of the electrode structure. The trenches are oriented so that at least the regions of the insulation structure which are provided in the upper region of the trenches overlap one another in an overlap region. The contact hole is arranged above the at least two trenches in such a way that at least parts of the overlap region and at least one of the electrode structure parts are contact-connected via the contact hole.
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Infineon Technologies Austria AG
Maginot Moore & Beck
Nguyen Cuong Q
Tran Trang Q
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