Semiconductor component and method for fabricating it

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S328000, C257S329000, C257S331000, C257S332000, C257S333000, C257S334000, C257S335000, C257S336000, C257SE29201, C365S149000

Reexamination Certificate

active

07741675

ABSTRACT:
A semiconductor component has a semiconductor body in which a trench structure is provided. An electrode structure embedded in the trench structure is at least partly insulated from its surroundings by an insulation structure, and is contact-connected in a contact-connecting region via a contact hole that penetrates through an upper region of the insulation structure. The semiconductor component has at least two trenches running next to one another, at least one of said trenches containing a part of the electrode structure. The trenches are oriented so that at least the regions of the insulation structure which are provided in the upper region of the trenches overlap one another in an overlap region. The contact hole is arranged above the at least two trenches in such a way that at least parts of the overlap region and at least one of the electrode structure parts are contact-connected via the contact hole.

REFERENCES:
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patent: 5321289 (1994-06-01), Baba et al.
patent: 6815767 (2004-11-01), Nakamura et al.
patent: 7087958 (2006-08-01), Chuang et al.
patent: 2003/0001202 (2003-01-01), Kitamura
patent: 2003/0146470 (2003-08-01), Hijzen et al.
patent: 100 51 909 (2002-05-01), None
patent: 102 20 810 (2002-11-01), None
patent: 1 300 886 (2003-04-01), None

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