Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-05-31
2010-02-02
Lee, Calvin (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S140000
Reexamination Certificate
active
07655992
ABSTRACT:
The invention is directed to providing a resistor with high reliability. The invention is also directed to miniaturizing a semiconductor device having a MOS transistor and a resistor element on the same semiconductor substrate. An N-type well region is formed in a front surface of a P-type semiconductor substrate, and a P−-type resistor layer is formed in a front surface of the well region. A conductive layer is annularly formed on the well region so as to surround the resistor layer. A predetermined voltage is applied to the conductive layer and a channel is not formed under the conductive layer during normal operation, thereby isolating a pull-down resistor from the other elements (e.g. a P-channel type MOS transistor). The resistor layer and an element isolation insulation film do not contact each other. Both the PMOS and the pull-down resistor are formed in one region surrounded by the element isolation insulation film.
REFERENCES:
patent: 6388252 (2002-05-01), Takahashi et al.
patent: 05-175228 (1993-07-01), None
patent: 9-26758 (1997-01-01), None
patent: 2003-224267 (2003-08-01), None
Kanai Masaru
Takahashi Shuichi
Yamada Yutaka
Lee Calvin
Morrison & Foerster / LLP
Sanyo Electric Co,. Ltd.
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