Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-29
2010-12-07
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C714S725000
Reexamination Certificate
active
07849435
ABSTRACT:
Methods and structures utilizing multiple configuration bitstreams to program integrated circuits (ICs) such as programmable logic devices, thereby enabling the utilization of partially defective ICs. A user design is implemented two or more times, preferably utilizing different programmable resources as much as possible in each configuration bitstream. The resulting user configuration bitstreams are stored along with associated test bitstreams in a memory device, e.g., a programmable read-only memory (PROM). Under the control of a configuration control circuit or device, the test bitstreams are loaded into a partially defective IC and tested using an automated testing procedure. When a test bitstream is found that enables the associated user design to function correctly in the programmed IC, i.e., that avoids the defective programmable resources in the IC, the associated user bitstream is loaded into the IC, the configuration procedure terminates, and the programmed IC begins to function according to the user design.
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Cartier Lois D.
Levin Naum B
Xilinx , Inc.
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