SOI substrates and SOI devices, and methods for forming the...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C438S407000, C438S480000, C257SE21563

Reexamination Certificate

active

07666721

ABSTRACT:
An improved semiconductor-on-insulator (SOI) substrate is provided, which contains a patterned buried insulator layer at varying depths. Specifically, the SOI substrate has a substantially planar upper surface and comprises: (1) first regions that do not contain any buried insulator, (2) second regions that contain first portions of the patterned buried insulator layer at a first depth (i.e., measured from the planar upper surface of the SOI substrate), and (3) third regions that contain second portions of the patterned buried insulator layer at a second depth, where the first depth is larger than the second depth. One or more field effect transistors (FETs) can be formed in the SOI substrate. For example, the FETs may comprise: channel regions in the first regions of the SOI substrate, source and drain regions in the second regions of the SOI substrate, and source/drain extension regions in the third regions of the SOI substrate.

REFERENCES:
patent: 5494846 (1996-02-01), Yamazaki
patent: 5702957 (1997-12-01), Padmanabhan
patent: 5712173 (1998-01-01), Liu et al.
patent: 5930642 (1999-07-01), Moore et al.
patent: 5963798 (1999-10-01), Kim et al.
patent: 6063652 (2000-05-01), Kim
patent: 6069054 (2000-05-01), Choi
patent: 6255145 (2001-07-01), Ajmera et al.
patent: 6281593 (2001-08-01), Brown et al.
patent: 6287901 (2001-09-01), Christensen et al.
patent: 6294817 (2001-09-01), Srinivasan et al.
patent: 6333532 (2001-12-01), Davari et al.
patent: 6380037 (2002-04-01), Osanai
patent: 6429099 (2002-08-01), Christensen et al.
patent: 6465852 (2002-10-01), Ju
patent: 6472753 (2002-10-01), Kondo et al.
patent: 6475868 (2002-11-01), Hao et al.
patent: 6531741 (2003-03-01), Hargrove et al.
patent: 6958282 (2005-10-01), Huttner et al.
patent: 7250351 (2007-07-01), Furukawa et al.
patent: 7323373 (2008-01-01), Mathew et al.
patent: 2001/0020722 (2001-09-01), Yang
patent: 2004/0195626 (2004-10-01), Yamada et al.
patent: 2005/0242397 (2005-11-01), Nagano et al.
patent: 2006/0231892 (2006-10-01), Furukawa et al.
patent: 2006/0234428 (2006-10-01), Furukawa et al.
patent: 2007/0172996 (2007-07-01), Mathew et al.
patent: 1379464 (2002-11-01), None
patent: 409064323 (1997-03-01), None
Stanley Wolf, Silicon Processing For the VLSI Era, 1990, vol. II, pp. 66-67.

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