Positive resist composition and method for forming resist...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S326000, C430S910000, C430S921000, C430S922000

Reexamination Certificate

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07816066

ABSTRACT:
A positive resist composition includes a resin component (A), and an acid generator component (B) which generates an acid upon exposure and includes an acid generator (B1) represented by general formula (B1):(wherein R51represents a straight chain, branched chain, or cyclic alkyl group, or a straight chain, branched chain, or cyclic fluorinated alkyl group; R52represents a hydrogen atom, a hydroxyl group, a halogen atom, a straight chain, branched chain, or cyclic alkyl group, a straight chain or branched chain halogenated alkyl group, or a straight chain or branched chain alkoxy group; R53represents an aryl group which may include a substituent; and n represents an integer from 1 to 3).

REFERENCES:
patent: 6548220 (2003-04-01), Uetani et al.
patent: 6602647 (2003-08-01), Iwasa et al.
patent: 6638685 (2003-10-01), Maeda et al.
patent: 6849384 (2005-02-01), Iwasa et al.
patent: 6982140 (2006-01-01), Hada et al.
patent: 7189492 (2007-03-01), Kodama et al.
patent: 7371503 (2008-05-01), Miyamatsu et al.
patent: 2004/0224251 (2004-11-01), Toishi et al.
patent: 2005/0095532 (2005-05-01), Kodama et al.
patent: 2006/0040203 (2006-02-01), Kodama et al.
patent: 1586570 (2005-10-01), None
patent: 2003005372 (2003-01-01), None
patent: 2003-307850 (2003-10-01), None
International Search Report from PCT/JP2006/307478, mailed May 2, 2006.
Office Action issued on counterpart Chinese Application No. 200680019830.2, dated Aug. 17, 2010.

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