System and method for frequency offset testing

Details System and method for frequency offset testing System and method for frequency offset testing

2006-11-08

2010-06-08

Patel, Niketa I (Department: 2181)

Electrical computers and digital data processing systems: input/

Input/output data processing

Input/output process timing

C710S029000, C710S034000, C710S060000, C709S233000, C702S110000, C702S118000, C702S124000, C702S125000

Reexamination Certificate

active

07734848

ABSTRACT:
Described is a system and method for frequency offset testing. The system comprises an electronic device, a first testing device providing a reference clock signal at a first frequency to the electronic device, and a second testing device receiving data from the electronic device at the first frequency and transmitting data to the electronic device at a second frequency. The second frequency is equal to a product of the first frequency and a frequency offset value.

REFERENCES:
patent: 6002671 (1999-12-01), Kahkoska et al.
patent: 6445773 (2002-09-01), Liang et al.
patent: 2002/0103618 (2002-08-01), Schleifer et al.
patent: 2005/0069031 (2005-03-01), Sunter et al.
patent: 2005/0240698 (2005-10-01), Rentschler et al.
patent: 2006/0149492 (2006-07-01), Guidry
patent: 2007/0239389 (2007-10-01), Heaton et al.

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