Method and apparatus for characterizing signals

Details Method and apparatus for characterizing signals Method and apparatus for characterizing signals

2007-04-25

2010-12-28

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07861191

ABSTRACT:
Methods and corresponding computer systems for characterizing signals and applications thereof are provided that use a functional depending on signal waveforms.

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