Self-reparable semiconductor and method thereof

Details Self-reparable semiconductor and method thereof Self-reparable semiconductor and method thereof

2006-11-08

2010-02-02

Le, Dieu-Minh (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C712S020000

Reexamination Certificate

active

07657784

ABSTRACT:
A self-reparable semiconductor comprises M functional units each including N sub-functional units. Corresponding ones of the N sub-functional units in each of the M functional units perform the same function. At least two of the N sub-functional units in one of the M functional units perform different functions. A first spare functional unit includes X sub-functional units, wherein X is greater than or equal to one and less than or equal to N and wherein the X sub-functional units of. the first spare functional unit are functionally interchangeable with corresponding sub-functional units of the M functional units and wherein the X sub-functional units are provided for the at least two of the N sub-functional units. A plurality of switching devices replace at least one of the N sub-functional units with at least one of the X sub-functional units when the at least one of the N sub-functional units is non-operable.

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