Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-06-10
2009-06-09
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185190, C365S185090
Reexamination Certificate
active
07545677
ABSTRACT:
A read method of a non-volatile memory device includes reading an initial threshold voltage value of an index cell from threshold voltage information cells that store information indicating the initial threshold voltage, determining a current threshold voltage value from the index cell, and comparing the initial threshold voltage value and the current threshold voltage value to calculate a shifted threshold voltage level of the index cell. A read voltage is changed by the shifted threshold voltage level to read user data using the changed read voltage.
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Chae Dong-Hyuk
Kang Dong-Ku
Lee Seung-Jae
Hoang Huan
Samsung Electronics Co,. Ltd.
Volentine & Whitt P.L.L.C.
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