Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-07-03
2009-06-09
Nhu, David (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S649000, C257S760000, C257SE21170, C257SE21221, C257SE21293, C257SE21304, C257SE21646
Reexamination Certificate
active
07544983
ABSTRACT:
Following CMP, a magnetic tunnel junction stack may protrude through the oxide that surrounds it, making it susceptible to possible shorting to its sidewalls. The present invention overcomes this problem by depositing silicon nitride spacers on these sidewalls prior to oxide deposition and CMP. So, even though the stack may protrude through the top surface of the oxide after CMP, the spacers serve to prevent possible later shorting to the stack.
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Ackerman Stephen B.
Applied Spintronics Inc.
Headway Technologies Inc.
Nhu David
Saile Ackerman LLC
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