Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2008-01-03
2009-06-02
Chu, John S (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S271100, C430S273100, C430S326000, C430S330000
Reexamination Certificate
active
07541132
ABSTRACT:
A resist film made of a chemically amplified resist material including a polymer; a photo-acid generator and carbamoyl oxime is formed on a substrate. Subsequently, pattern exposure is performed by selectively irradiating the resist film with exposing light. After the pattern exposure, the resist film is baked, and the baked resist film is developed, so as to form a resist pattern made of the resist film.
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Yoon et al. “Influence of Resin Properties to Resist Performance at ArF Lithography”, Proceedings of SPIE, vol. 5376, pp. 583-590, 2004.
Endo Masayuki
Sasago Masaru
Chu John S
McDermott Will & Emery LLP
Panasonic Corporation
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