Chemically amplified resist material, topcoat film material...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S271100, C430S273100, C430S326000, C430S330000

Reexamination Certificate

active

07541132

ABSTRACT:
A resist film made of a chemically amplified resist material including a polymer; a photo-acid generator and carbamoyl oxime is formed on a substrate. Subsequently, pattern exposure is performed by selectively irradiating the resist film with exposing light. After the pattern exposure, the resist film is baked, and the baked resist film is developed, so as to form a resist pattern made of the resist film.

REFERENCES:
patent: 5650261 (1997-07-01), Winkle
patent: 5691100 (1997-11-01), Kudo et al.
patent: 6746828 (2004-06-01), Richter et al.
patent: 2006/0263702 (2006-11-01), Yamashita et al.
patent: 2007/0243487 (2007-10-01), Anze et al.
Yoon et al. “Influence of Resin Properties to Resist Performance at ArF Lithography”, Proceedings of SPIE, vol. 5376, pp. 583-590, 2004.

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