Insulated gate semiconductor device and method of...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S330000, C257S565000, C257SE29027, C257SE29066, C438S270000, C438S272000, C438S309000

Reexamination Certificate

active

07633122

ABSTRACT:
A trench MOSFET includes mesa regions between the trenches. The mesa regions are connected to an emitter electrode to fix the mesa region potential so that the mesa regions do not form a floating structure. P-type base regions are distributed in the mesa regions, and the distributed p-type base regions (e.g., the limited regions in the mesa regions) are provided with an emitter structure. The trench MOSFET can lower the switching losses, reducing the total losses while suppressing the ON-state voltage drop of the trench IGBT as low as the ON-state voltage drop of the IEGT, and improving the turn-on characteristics thereof. The trench MOSFET also can reduce the capacitance between the gates and the emitter thereof, since the regions where the gate electrode faces the emitter structure are reduced. The trench MOSFET can have trench gate structures set at a narrow interval to relax the electric field localization to the bottom portions of the trenches and obtain a high breakdown voltage. The trench MOSFET narrows the mesa region width between the trenches such that the portions of the n-type layer in the mesa regions extending between the trenches are depleted easily by applying a voltage of around several volts.

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Second Office Action Reasons of Rejection issued in corresponding Chinese Patent Application No. 2005101036853 dated Jul. 17, 2009.

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