Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-09-13
2009-12-01
Phung, Anh (Department: 2824)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S321000, C257SE29300
Reexamination Certificate
active
07626224
ABSTRACT:
A split gate memory cell. First and second well regions of respectively first and second conductivity types are formed in the substrate. A floating gate is disposed on a junction of the first and second well regions and insulated from the substrate. A control gate is disposed over the sidewall of the floating gate and insulated from the substrate and the floating gate and partially extends to the upper surface of the floating gate. A doping region of the first conductivity type is formed in the second well region. The first well region and the doping region respectively serve as source and drain regions of the split gate memory cell.
REFERENCES:
patent: 5006974 (1991-04-01), Kazerounian et al.
patent: 5747849 (1998-05-01), Kuroda et al.
patent: 2003/0142550 (2003-07-01), Kawahara et al.
patent: 2005/0079662 (2005-04-01), Miki
patent: 11-026729 (1999-01-01), None
English abstract of JP11-026729, dated Jan. 29, 1999.
Chih Yue-Der
Chu Wen-Ting
Chung Shine
Bernstein Allison P
Phung Anh
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas Kayden Horstemeyer & Risley
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