Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2006-11-10
2009-11-17
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S014000, C438S018000, C438S787000, C438S788000, C257SE21521
Reexamination Certificate
active
07618833
ABSTRACT:
A method for pre-treating an epitaxial layer performed before evaluation of the epitaxial layer by making the epitaxial layer contact with a metal electrode by a capacitance-voltage measurement, the method comprising; applying carbon-bearing compound to a surface of the epitaxial layer; subsequently irradiating ultraviolet light to the surface of the epitaxial layer; and thereby forming an oxide film on the surface of the epitaxial layer.
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Miyazaki Sumio
Uchida Shinjirou
Garber Charles D
Kolisch & Hartwell, P.C.
Roman Angel
Sumco Corporation
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