Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-08-31
2009-12-29
Lee, Eugene (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S231000, C257S232000, C257S290000, C257S292000, C257SE27131, C257SE27132, C257SE27133
Reexamination Certificate
active
07638826
ABSTRACT:
An object of the present invention is to prevent a sensitivity difference between pixels. There are disposed plural unit cells each including plural photodiodes101A and101B, plural transfer MOSFETs102A and102B arranged corresponding to the plural photodiodes, respectively, and a common MOSFET104which amplifies and outputs signals read from the plural photodiodes. Each pair within the unit cell, composed of the photodiode and the transfer MOSFET provided corresponding to the photodiode, has translational symmetry with respect to one another. Within the unit cell, there are included a reset MOSFET and selecting MOSFET.
REFERENCES:
patent: 4663669 (1987-05-01), Kinoshita et al.
patent: 4774585 (1988-09-01), Suga et al.
patent: 4780764 (1988-10-01), Kinoshita et al.
patent: 4821105 (1989-04-01), Suga et al.
patent: 5121225 (1992-06-01), Murata et al.
patent: 5261013 (1993-11-01), Murata et al.
patent: 5475211 (1995-12-01), Ogura et al.
patent: 5955753 (1999-09-01), Takahashi
patent: 6040592 (2000-03-01), McDaniel et al.
patent: 6051857 (2000-04-01), Miida
patent: 6124888 (2000-09-01), Terada et al.
patent: 6188094 (2001-02-01), Kochi et al.
patent: 6218656 (2001-04-01), Guidash
patent: 6352869 (2002-03-01), Guidash
patent: 6423994 (2002-07-01), Guidash
patent: 6486913 (2002-11-01), Afghahi et al.
patent: 6605850 (2003-08-01), Kochi et al.
patent: 6633334 (2003-10-01), Sakurai et al.
patent: 6657665 (2003-12-01), Guidash
patent: 6670990 (2003-12-01), Kochi et al.
patent: 6801253 (2004-10-01), Yonemoto et al.
patent: 6946637 (2005-09-01), Kochi et al.
patent: 6960751 (2005-11-01), Hiyama et al.
patent: 7110030 (2006-09-01), Kochi et al.
patent: 2003/0164887 (2003-09-01), Koizumi et al.
patent: 2005/0098805 (2005-05-01), Okita et al.
patent: 2005/0122418 (2005-06-01), Okita et al.
patent: 2005/0168618 (2005-08-01), Okita et al.
patent: 2005/0174552 (2005-08-01), Takada et al.
patent: 2005/0179796 (2005-08-01), Okita et al.
patent: 2005/0205902 (2005-09-01), Hara et al.
patent: 2005/0237405 (2005-10-01), Ohkawa
patent: 2005/0268960 (2005-12-01), Hiyama et al.
patent: 2005/0269604 (2005-12-01), Koizumi et al.
patent: 2006/0027843 (2006-02-01), Ogura et al.
patent: 2006/0043393 (2006-03-01), Okita et al.
patent: 2006/0044434 (2006-03-01), Okita et al.
patent: 2006/0044439 (2006-03-01), Hiyama et al.
patent: 2006/0208161 (2006-09-01), Okita et al.
patent: 2006/0208291 (2006-09-01), Koizumi et al.
patent: 2006/0208292 (2006-09-01), Itano et al.
patent: 2006/0221667 (2006-10-01), Ogura et al.
patent: 1 017 106 (2000-07-01), None
patent: 9-46596 (1997-02-01), None
patent: 11-122532 (1999-04-01), None
patent: 2000-232216 (2000-08-01), None
patent: 2001-298177 (2001-10-01), None
patent: 2001-298177 (2001-10-01), None
Guidash et al., “A 0.6 micrometer CMOS Pinned Photodiode Color Imager Technology”, IEDM, 1997, pp. 927-929.
Mitsuyoshi et al., “¼-Inch 2-Mpixel MOS Image Sensor With 1.75 Transistor/Pixel”, IEEE Journal of Solid-State Circuits, vol. 39, No. 12, Dec. 2004.
Chapman et al., Creating 35 mm Camera Active Pixel Sensors, Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Nov. 1999, pp. 22-30.
Hiyama Hiroki
Ogura Masanori
Sakai Seiichiro
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Gumedzoe Peniel M
Lee Eugene
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