Manufacturing method of semiconductor substrate and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S455000, C257SE21561

Reexamination Certificate

active

07635617

ABSTRACT:
In a process of forming a single-crystalline semiconductor layer bonded to a glass substrate by low-temperature heat treatment, before a bonding and separation step in which the single-crystalline semiconductor layer is bonded to the glass substrate, the glass substrate is heated at a temperature higher than a heat temperature in the bonding and separation step. In a bonding step between the single-crystalline semiconductor layer and the glass substrate, the single-crystalline semiconductor layer is heated at a temperature close to a strain point of the glass substrate, specifically at a temperature in a range from minus 50° C. to plus 50° C. of a strain point. Accordingly, the glass substrate is subjected to heat treatment in advance at a temperature higher than the temperature close to the strain point, specifically, at a temperature higher than the temperature in a range from minus 50° C. to plus 50° C. of the strain point.

REFERENCES:
patent: 5236850 (1993-08-01), Zhang
patent: 5254208 (1993-10-01), Zhang
patent: 5374564 (1994-12-01), Bruel
patent: 5492843 (1996-02-01), Adachi et al.
patent: 5837619 (1998-11-01), Adachi et al.
patent: 5876497 (1999-03-01), Atoji
patent: 6008076 (1999-12-01), Codama et al.
patent: 6103009 (2000-08-01), Atoji
patent: 6127702 (2000-10-01), Yamazaki et al.
patent: 6271101 (2001-08-01), Fukunaga
patent: 6335231 (2002-01-01), Yamazaki et al.
patent: 6380046 (2002-04-01), Yamazaki
patent: 6388652 (2002-05-01), Yamazaki et al.
patent: 6479334 (2002-11-01), Codama et al.
patent: 6602761 (2003-08-01), Fukunaga
patent: 6686623 (2004-02-01), Yamazaki
patent: 6778164 (2004-08-01), Yamazaki et al.
patent: 6803264 (2004-10-01), Yamazaki et al.
patent: 6875633 (2005-04-01), Fukunaga
patent: 6908797 (2005-06-01), Takano
patent: 7119365 (2006-10-01), Takafuji et al.
patent: 7176525 (2007-02-01), Fukunaga
patent: 7199024 (2007-04-01), Yamazaki
patent: 7256776 (2007-08-01), Yamazaki et al.
patent: 2004/0104424 (2004-06-01), Yamazaki
patent: 2005/0009252 (2005-01-01), Yamazaki et al.
patent: 2005/0260800 (2005-11-01), Takano
patent: 2007/0063281 (2007-03-01), Takafuji et al.
patent: 2007/0087488 (2007-04-01), Moriwaka
patent: 2007/0108510 (2007-05-01), Fukunaga
patent: 2007/0173000 (2007-07-01), Yamazaki
patent: 2007/0184632 (2007-08-01), Yamazaki et al.
patent: 2007/0281440 (2007-12-01), Cites et al.
patent: 2007/0291022 (2007-12-01), Yamazaki et al.
patent: 2008/0246109 (2008-10-01), Ohnuma et al.
patent: 02-054532 (1990-02-01), None
patent: 11-163363 (1999-06-01), None
patent: 2004-87606 (2004-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Manufacturing method of semiconductor substrate and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Manufacturing method of semiconductor substrate and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manufacturing method of semiconductor substrate and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4129887

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.