Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-11-17
2009-08-25
Deo, Duy-Vu N (Department: 1792)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S620000, C438S621000, C438S622000, C438S624000, C438S626000
Reexamination Certificate
active
07579270
ABSTRACT:
It is an object of the present invention to provide a method for manufacturing a highly reliable semiconductor device with preferable yield. In the invention, two-step etching is performed when selectively removing an interlayer insulating film with at least two layers constituting a semiconductor device, and forming an opening. One feature of the invention is that at least either one of a first gas (a first etching gas) and a second gas (a second etching gas) used at the time of the two-step etching is added with an inert gas.
REFERENCES:
patent: 5453406 (1995-09-01), Chen
patent: 5626775 (1997-05-01), Roberts et al.
patent: 5747383 (1998-05-01), Chen et al.
patent: 5882761 (1999-03-01), Kawami et al.
patent: 6093457 (2000-07-01), Okumura et al.
patent: 6159862 (2000-12-01), Yamada et al.
patent: 6184147 (2001-02-01), Yang et al.
patent: 6521912 (2003-02-01), Sakama et al.
patent: 6538390 (2003-03-01), Fujita et al.
patent: 6638848 (2003-10-01), Fukasawa et al.
patent: 6646287 (2003-11-01), Ono et al.
patent: 6710387 (2004-03-01), Nakamura
patent: 6773996 (2004-08-01), Suzawa et al.
patent: 6790784 (2004-09-01), Catabay et al.
patent: 6861710 (2005-03-01), Murakami et al.
patent: 6943104 (2005-09-01), Fukasawa et al.
patent: 7088322 (2006-08-01), Koyama et al.
patent: 7144819 (2006-12-01), Sato et al.
patent: 7242021 (2007-07-01), Yamazaki et al.
patent: 2002/0113248 (2002-08-01), Yamagata et al.
patent: 2003/0030146 (2003-02-01), Tamaru et al.
patent: 2005/0045891 (2005-03-01), Yamazaki et al.
patent: 2007/0111424 (2007-05-01), Suzawa et al.
patent: 0 993 235 (2000-04-01), None
patent: 08-330283 (1996-12-01), None
patent: 09-148066 (1997-06-01), None
patent: 09-279367 (1997-10-01), None
patent: 11-111693 (1999-04-01), None
patent: 11-194499 (1999-07-01), None
patent: 11-271753 (1999-10-01), None
patent: 2000-058513 (2000-02-01), None
patent: 2000-252359 (2000-09-01), None
patent: 2001-110776 (2001-04-01), None
patent: 2001-203076 (2001-07-01), None
patent: 2002-313786 (2002-10-01), None
Miyashita et al., “Full Color Displays Fabricated by Ink-Jet Printing,” Asia Display / IDW '01, pp. 1399-1402.
Monoe Shigeharu
Sasagawa Shinya
Sato Tomohiko
Deo Duy-Vu N
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
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