Auto-calibration method for delay circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

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Details

C714S726000, C714S731000, C327S158000, C327S277000, C360S026000

Reexamination Certificate

active

07490273

ABSTRACT:
An auto-calibration method is applied to a delay circuit, which includes a plurality of delay chains. If the number of accumulative errors of a designated delay chain as a current delay path is larger than a threshold value, the delay circuit scans all the delay chains and records their accumulative error numbers during a unit of time; otherwise, the current delay path is maintained. Afterwards, the number of accumulative errors is compared between all the delay chains to find out which one of the delay chains has a minimum accumulative error number, and the delay chain with a minimum accumulative error number is designated as a new current delay path.

REFERENCES:
patent: 5123020 (1992-06-01), Yoshimura et al.
patent: 5789969 (1998-08-01), Davis et al.
patent: 6025745 (2000-02-01), Lee et al.
patent: 6794913 (2004-09-01), Stengel
patent: 6914492 (2005-07-01), Hui et al.
patent: 7100067 (2006-08-01), Hansen et al.

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