Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257S774000, C257SE21597, C257SE23067

Reexamination Certificate

active

07605080

ABSTRACT:
In a method of manufacturing a semiconductor device having a through electrode56that connects an electrode pad20of a semiconductor element14,which has a device forming layer18and the electrode pad20on one surface side, and a rewiring pattern52on other surface side of the semiconductor element14,the device forming layer18and the electrode pad20are formed on an upper surface side of the semiconductor element14,a first resist layer62is formed on surfaces of the electrode pad20and the device forming layer18,an opening64is formed in the electrode pad20by the etching, and a through hole54is formed in the semiconductor element14by the etching in a position that is communicated with the opening64.The device forming layer18is protected by the first resist layer62,and also a flip-chip connection can be applied by providing the through electrode56to attain a downsizing.

REFERENCES:
patent: 6620731 (2003-09-01), Farnworth et al.
patent: 6852621 (2005-02-01), Hanaoka et al.
patent: 6873054 (2005-03-01), Miyazawa et al.
patent: 2004/0212086 (2004-10-01), Dotta et al.
patent: 1 439 576 (2004-07-01), None
patent: 2002-373895 (2002-12-01), None
patent: 2002-373957 (2002-12-01), None

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