Method of fabricating polycrystalline silicon thin film for...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C438S166000, C438S798000

Reexamination Certificate

active

07635640

ABSTRACT:
A crystallization method of an amorphous semiconductor layer includes providing an amorphous semiconductor layer having a first thickness, crystallizing the amorphous semiconductor layer in a first direction, partially reducing the crystallized semiconductor layer to a second thickness less than the first thickness and crystallizing the etched semiconductor layer in a second direction.

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patent: WO 03/052833 (2003-06-01), None

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