Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-05-09
2009-02-03
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07486090
ABSTRACT:
A printed-circuit-board testing device that tests an electronic component disposed on a printed circuit board includes printed-circuit-board-tilt measuring means for measuring tilting of the printed circuit board, measuring means for measuring tilting of an arm having a probe that comes into contact with and tests the electronic component, correcting means for correcting the tilting of the arm on the basis of the tilting of the printed circuit board and the tilting of the arm, inputting means for inputting positional information of the electronic component, arm disposing means for disposing the arm to a predetermined position in accordance with the positional information and printed-circuit-board testing means for performing testing as a result of protruding the probe from the disposed arm.
REFERENCES:
patent: 5456001 (1995-10-01), Mori et al.
patent: 5982182 (1999-11-01), Chiu et al.
patent: 6472864 (2002-10-01), Emo et al.
patent: 6768964 (2004-07-01), Souda
patent: 6822464 (2004-11-01), Suzuki
patent: 2004-234837 (2004-08-01), None
U.S. Appl. No. 11/289,452, filed Nov. 30, 2005, Susumu Miyazawa.
Fujitsu Limited
Nguyen Ha Tran T
Nguyen Trung Q
Staas & Halsey , LLP
LandOfFree
Testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4091922