Test apparatus, manufacturing method, and test method

Details Test apparatus, manufacturing method, and test method Test apparatus, manufacturing method, and test method

2008-06-25

2009-11-03

Mai, Lam T (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C714S736000, C714S724000

Reexamination Certificate

active

07612698

ABSTRACT:
There is provided a test apparatus for testing a device under test, the test apparatus including: a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test; a reference signal output section that outputs an analogue reference signal in accordance with the digital input signal; a difference obtaining section that outputs an analogue difference signal representing a difference between the analogue reference signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and a determining section that determines whether the analogue output signal shows a defect or not based on the analogue difference signal.

REFERENCES:
patent: 4620302 (1986-10-01), Binoeder et al.
patent: 6057679 (2000-05-01), Slizynski et al.
patent: 6324665 (2001-11-01), Fay
patent: 7571363 (2009-08-01), Wallace et al.
patent: 2005/0219107 (2005-10-01), Guidry
patent: 2009/0027041 (2009-01-01), Kimura
patent: 7-321654 (1995-12-01), None

Affiliated with

Also associated with

Rating

Test apparatus, manufacturing method, and test method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus, manufacturing method, and test method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus, manufacturing method, and test method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4091923