Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2007-01-18
2009-12-22
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237400, C356S237600, C324S750010, C324S754120, C324S537000
Reexamination Certificate
active
07636155
ABSTRACT:
A method for isolating the emitting devices may be applied to various emission and laser microscopy systems. A point spread function is convolved with CAD data of devices involved in the emission. The calculated signal intensity of the devices is varied until the difference between the calculated signal and the measured signal provides best fit. The best fit is performed for each on/off state for all configurations of the involved devices. The variance of the best curve fit for all of the configurations is used to assign probability to each state. The best fit indicates the correct state of each of the involved devices, thereby indicating which devices emit. At times, when the transistors are extremely close, a weighted solution is calculated. The weights are based on the probability of each solution.
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Alli Iyabo S
Bach, Esq. Joseph
DCG Systems, Inc.
Nixon & Peabody LLP
Toatley Jr. Gregory J
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