Temperature-controlled metallic dry-fill process

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S625000

Reexamination Certificate

active

07618888

ABSTRACT:
A method for performing ionized physical vapor deposition (iPVD) is described, whereby the substrate temperature can be rapidly changed to control a metal deposition process and increase the quality of the metal deposited. In one embodiment, a copper deposition process can be performed.

REFERENCES:
patent: 6080287 (2000-06-01), Drewery et al.
patent: 6132564 (2000-10-01), Licata
patent: 6197165 (2001-03-01), Drewery et al.
patent: 6268284 (2001-07-01), Cerio, Jr.
patent: 6287435 (2001-09-01), Drewery et al.
patent: 6373135 (2002-04-01), Weber
patent: 6755945 (2004-06-01), Yasar et al.
patent: 7141763 (2006-11-01), Moroz
patent: 7348266 (2008-03-01), Cerio, Jr.
patent: 2003/0034244 (2003-02-01), Yasar et al.
patent: 2004/0188239 (2004-09-01), Robison et al.
patent: WO2004088732 (2004-10-01), None

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