Semiconductor device made by multiple anneal of stress...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S938000, C257SE21241

Reexamination Certificate

active

07569499

ABSTRACT:
The invention provides a method of fabricating a semiconductor device. In one aspect, the method comprises forming a stress inducing layer over a semiconductor substrate, subjecting the stress inducing layer to a first temperature anneal, and subjecting the semiconductor substrate to a second temperature anneal subsequent to the first temperature anneal, wherein the second temperature anneal is higher than the first temperature anneal.

REFERENCES:
patent: 5997634 (1999-12-01), Sandhu et al.
patent: 6544854 (2003-04-01), Puchner et al.
patent: 6774015 (2004-08-01), Cohen et al.
patent: 6797556 (2004-09-01), Murthy et al.
patent: 6858506 (2005-02-01), Chang
patent: 6916694 (2005-07-01), Hanafi et al.
patent: 7101742 (2006-09-01), Ko et al.
patent: 2004/0217393 (2004-11-01), Takizawa
“Stress Memorization Technique (SMT) by Selectively Strained Nitride Capping for Sub-65 nm High-Performance Strained-Si Device Application,” Symp. VLSI Technol. (C.-H. Chen, et al.), p. 56 (2004).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device made by multiple anneal of stress... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device made by multiple anneal of stress..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device made by multiple anneal of stress... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4081984

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.