Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-03-28
2009-08-04
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S938000, C257SE21241
Reexamination Certificate
active
07569499
ABSTRACT:
The invention provides a method of fabricating a semiconductor device. In one aspect, the method comprises forming a stress inducing layer over a semiconductor substrate, subjecting the stress inducing layer to a first temperature anneal, and subjecting the semiconductor substrate to a second temperature anneal subsequent to the first temperature anneal, wherein the second temperature anneal is higher than the first temperature anneal.
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Brady III Wade J.
Chaudhari Chandra
Franz Warren L.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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