Semiconductor memory device capable of effectively testing...

Details Semiconductor memory device capable of effectively testing... Semiconductor memory device capable of effectively testing...

2006-12-28

2009-02-17

Phan, Trong (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C365S189080, C365S194000, C365S230030

Reexamination Certificate

active

07492653

ABSTRACT:
The present invention relates to an apparatus and a method for detecting a failure of data in the semiconductor memory device. The semiconductor memory device according to the present invention includes: a global I/O line for transferring data between an external circuit and a local I/O line; an I/O sense amplifier for controlling a data transmission between the local I/O line and the global I/O line; and an I/O sense amplifier control unit for controlling the I/O sense amplifier in response to a test mode signal in order to test the semiconductor memory device, independent of the data outputted from a memory cell.

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