Method and apparatus for testing an integrated device's...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

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C714S731000, C714S744000, C714S707000

Reexamination Certificate

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07496803

ABSTRACT:
A plurality of timing diagrams and different versions of circuits to test an integrated device in a test mode of operation. The invention allows for pulling in a strobe and eliminating the need for delay cells in strobe pads and a clock generation that facilitates varying the duty cycle for pulling in the strobe and pushing out the data.

REFERENCES:
patent: 7363563 (2008-04-01), Hissen et al.
patent: 2001/0014922 (2001-08-01), Kuge

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